Lanthanide ion incorporation in gallium nitride through a salt melt process

Rahman, F. (2009) Lanthanide ion incorporation in gallium nitride through a salt melt process. Journal of Optoelectronics and Advanced Materials, 11(3), pp. 326-330.

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Abstract

Lanthanide ions have been doped in epitaxial gallium nitride material through a liquid phase salt melt process. The technique involves a brief photolytic etching of the sample surface followed by heating with a melt of a selected lanthanide halide under reducing conditions. In this work, hydrogen sulphide entrained in nitrogen gas was used to produce the reducing ambient. Europium-doped GaN pumped with above-gap UV radiation showed strong red emission. The temperature dependence of the intensity of this red emission is also described. Neodymium caused surface pitting and consequent enhancement of defect-generated yellow luminescence. Doping with cerium resulted in a diffuse broadband ultraviolet emission but no specific emission lines

Item Type:Articles
Keywords:Chemical-vapor-deposition, dependence, earth-doped gan, electroluminescent devices, emission, enhancement, etching, gallium nitride, gas, intensity, ions, lanthanide ions, lines, optics, photoluminescence, physics, rare earths, red-light emission, room-temperature, salt melt, science, single-crystals, thermal doping, thin-films, vacancies, yellow luminescence
Status:Published
Refereed:Yes
Glasgow Author(s) Enlighten ID:Rahman, Dr Faiz
Authors: Rahman, F.
College/School:College of Science and Engineering > School of Engineering > Electronics and Nanoscale Engineering
Journal Name:Journal of Optoelectronics and Advanced Materials
Journal Abbr.:JOAM
ISSN:1454-4164
ISSN (Online):1841 - 7132

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