Coherent backscattering in optical microring resonators

Morichetti, F., Canciamilla, A., Martinelli, M., Samarelli, A., De La Rue, R.M. , Sorel, M. and Melloni, A. (2010) Coherent backscattering in optical microring resonators. Applied Physics Letters, 96(8), (doi: 10.1063/1.3330894)

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The effects of backscattering induced by waveguide sidewall roughness in integrated ring resonators (RRs) are experimentally observed. We demonstrate that coherent backscattering, originated by multiple round trips in the RR, increases with the square of the effective group index of the cavity and can dramatically affect the behavior of integrated RRs even at moderate quality factors of 10(4). From our results backscattering emerges as one of the most severe limiting factors on the performance of RRs fabricated with state-of-the-art silicon-on-insulator nanowaveguides

Item Type:Articles
Keywords:Fabrication, integrated optics, light coherence, light scattering, micro-optics, optical, resonators, optical waveguides, performance, physics, silicon, silicon-on-insulator, surface-roughness, wave-guides
Glasgow Author(s) Enlighten ID:Sorel, Professor Marc and De La Rue, Professor Richard and Samarelli, Mr Antonio
Authors: Morichetti, F., Canciamilla, A., Martinelli, M., Samarelli, A., De La Rue, R.M., Sorel, M., and Melloni, A.
Subjects:Q Science > QC Physics
College/School:College of Science and Engineering > School of Engineering > Electronics and Nanoscale Engineering
Journal Name:Applied Physics Letters
Journal Abbr.:Appl. Phys. Lett.
ISSN (Online):1077-3118
Published Online:26 February 2010

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