Effects of phosphorous and antimony doping on thin Ge layers grown on Si

Yu, X. et al. (2024) Effects of phosphorous and antimony doping on thin Ge layers grown on Si. Scientific Reports, 14(1), 7969. (doi: 10.1038/s41598-024-57937-8) (PMID:38575676) (PMCID:PMC10995153)

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Abstract

Suppression of threading dislocations (TDs) in thin germanium (Ge) layers grown on silicon (Si) substrates has been critical for realizing high-performance Si-based optoelectronic and electronic devices. An advanced growth strategy is desired to minimize the TD density within a thin Ge buffer layer in Ge-on-Si systems. In this work, we investigate the impact of P dopants in 500-nm thin Ge layers, with doping concentrations from 1 to 50 × 1018 cm−3. The introduction of P dopants has efficiently promoted TD reduction, whose potential mechanism has been explored by comparing it to the well-established Sb-doped Ge-on-Si system. P and Sb dopants reveal different defect-suppression mechanisms in Ge-on-Si samples, inspiring a novel co-doping technique by exploiting the advantages of both dopants. The surface TDD of the Ge buffer has been further reduced by the co-doping technique to the order of 107 cm−2 with a thin Ge layer (of only 500 nm), which could provide a high-quality platform for high-performance Si-based semiconductor devices.

Item Type:Articles
Additional Information:This work was supported by the UK Engineering and Physical Sciences Research Council (EP/P006973/1, EP/R029075/1, EP/T028475/1, EP/V036327/1, EP/V048732/1, and EP/X015300/1).
Status:Published
Refereed:Yes
Glasgow Author(s) Enlighten ID:Sweeney, Professor Stephen
Authors: Yu, X., Jia, H., Yang, J., Masteghin, M. G., Beere, H., Mtunzi, M., Deng, H., Huo, S., Chen, C., Chen, S., Tang, M., Sweeney, S. J., Ritchie, D., Seeds, A., and Liu, H.
College/School:College of Science and Engineering > School of Engineering > Electronics and Nanoscale Engineering
Journal Name:Scientific Reports
Publisher:Nature Research
ISSN:2045-2322
ISSN (Online):2045-2322
Copyright Holders:Copyright © The Author(s) 2024
First Published:First published in Nature Research 14(1):7969
Publisher Policy:Reproduced under a Creative Commons licence

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