Samsudin, K., Cheng, B., Brown, A., Roy, S. and Asenov, A. (2005) Impact of body thickness fluctuations in nanometer scale UTB SOI MOSFETs on SRAM cell functionality. In: 6th European Conference on ULtimate Integration of Silicon - ULIS 2005, Bologna, Italy,
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Item Type: | Conference Proceedings |
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Keywords: | Body, Fluctuation, Fluctuations, Impact, Integration, MOSFET, MOSFETS, Scale, Silicon, Soi MOSFETS, SRAM, Thickness, Utb Soi, Utb-Soi |
Status: | Published |
Refereed: | Yes |
Glasgow Author(s) Enlighten ID: | Asenov, Professor Asen and Brown, Mr Andrew and Cheng, Dr Binjie and Roy, Professor Scott |
Authors: | Samsudin, K., Cheng, B., Brown, A., Roy, S., and Asenov, A. |
College/School: | College of Science and Engineering > School of Engineering > Electronics and Nanoscale Engineering |
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