Roy, G., Adamu-Lema, F., Brown, A., Roy, S. and Asenov, A. (2005) Intrinsic parameter fluctuations in conventional MOSFETs until the end of the ITRS. In: New Phenomena in Mesoscopic Structures - 7 (NPMS) and the fifth in the series of Surfaces and Interfaces of Mesoscopic Devices (SIMD), NPMS-7/SIMD-5, Maui, Hawaii,
Full text not currently available from Enlighten.
| Item Type: | Conference Proceedings |
|---|---|
| Keywords: | Device, Devices, Fluctuation, Fluctuations, Interface, Interfaces, Intrinsic Parameter Fluctuation, Intrinsic Parameter Fluctuations, MOSFET, MOSFETS, Parameter Fluctuations, Surface, Surfaces |
| Status: | Published |
| Refereed: | Yes |
| Glasgow Author(s) Enlighten ID: | Roy, Dr Gareth and Asenov, Professor Asen and Brown, Mr Andrew and Roy, Professor Scott |
| Authors: | Roy, G., Adamu-Lema, F., Brown, A., Roy, S., and Asenov, A. |
| College/School: | College of Science and Engineering > School of Engineering > Electronics and Nanoscale Engineering |
University Staff: Request a correction | Enlighten Editors: Update this record
Deposit and Record Details
Deposit and Record Details