Roy, G., Adamu-Lema, F., Brown, A., Roy, S. and Asenov, A. (2005) Simulation of combined sources of intrinsic parameter fluctuations in 'real' 35nm MOSFET. In: European Solid-State Device Research Conference 2005 - ESSDERC2005, Grenoble, France,
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| Item Type: | Conference Proceedings |
|---|---|
| Keywords: | Device, Fluctuation, Fluctuations, Intrinsic Parameter Fluctuation, Intrinsic Parameter Fluctuations, MOSFET, Parameter Fluctuations, Simulation |
| Status: | Published |
| Refereed: | Yes |
| Glasgow Author(s) Enlighten ID: | Roy, Dr Gareth and Asenov, Professor Asen and Brown, Mr Andrew and Roy, Professor Scott |
| Authors: | Roy, G., Adamu-Lema, F., Brown, A., Roy, S., and Asenov, A. |
| College/School: | College of Science and Engineering > School of Engineering > Electronics and Nanoscale Engineering |
| Publisher: | IEEE |
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