Riddet, C., Brown, A., Alexander, C., Watling, J., Roy, S. and Asenov, A. (2005) Impact of quantum confinement scattering on the magnitude of current fluctuations in double gate MOSFETs. In: Silicon Nanoelectronics Workshop 2005, Kyoto, Japan,
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Item Type: | Conference Proceedings |
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Keywords: | Confinement, Double Gate MOSFET, Fluctuation, Fluctuations, GAAS, Gate, Impact, Limit, MOSFET, MOSFETS, Performance, Quantum, Scattering, Silicon, Simulation |
Status: | Published |
Refereed: | Yes |
Glasgow Author(s) Enlighten ID: | Asenov, Professor Asen and Brown, Mr Andrew and Alexander, Dr Craig and Riddet, Mr Craig and Watling, Dr Jeremy and Roy, Professor Scott |
Authors: | Riddet, C., Brown, A., Alexander, C., Watling, J., Roy, S., and Asenov, A. |
College/School: | College of Science and Engineering > School of Engineering > Electronics and Nanoscale Engineering |
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