Yang, L., Watling, J., Asenov, A., Barker, J. and Roy, S. (2004) Sub-100nm strained Si CMOS : Device performance and circuit behavior. In: 7th International Conference on Solid State and Intergrated Circuit Technology, Beijing, China,
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Item Type: | Conference Proceedings |
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Keywords: | Behavior, CMOS, Device, Performance, Si, Strained Si, Strained-Si, Technology |
Status: | Published |
Refereed: | Yes |
Glasgow Author(s) Enlighten ID: | Barker, Professor John and Asenov, Professor Asen and Watling, Dr Jeremy and Roy, Professor Scott |
Authors: | Yang, L., Watling, J., Asenov, A., Barker, J., and Roy, S. |
College/School: | College of Science and Engineering > School of Engineering > Electronics and Nanoscale Engineering |
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