Yang, L., Watling, J., Wilkins, R., Barker, J. and Asenov, A. (2004) Monte-Carlo investigation of interface roughness scattering in relaxed and strained Si n-MOSFETs. In: Condensed Matter and Materials Physcis Conference - CMMP04, Warwick, UK,
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| Item Type: | Conference Proceedings |
|---|---|
| Keywords: | Interface, Interface Roughness, Interface Roughness Scattering, Monte Carlo, N-MOSFETS, Scattering, Si, Strained Si, Strained-Si |
| Status: | Published |
| Refereed: | Yes |
| Glasgow Author(s) Enlighten ID: | Barker, Professor John and Watling, Dr Jeremy and Asenov, Professor Asen |
| Authors: | Yang, L., Watling, J., Wilkins, R., Barker, J., and Asenov, A. |
| College/School: | College of Science and Engineering > School of Engineering > Electronics and Nanoscale Engineering |
| Publisher: | Institute of Physics |
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