The impact of soft-optical phonon scattering due to high-k dielectrics on the performance of sub-1oonm conventional and strained Si n-MOSFETs

Yang, L., Watling, J., Barker, J. and Asenov, A. (2004) The impact of soft-optical phonon scattering due to high-k dielectrics on the performance of sub-1oonm conventional and strained Si n-MOSFETs. In: 27th International Conference on Physics of Semiconductors, ICPS04, Arizona, USA,

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Item Type:Conference Proceedings
Keywords:Dielectrics, High-K, Impact, N-MOSFETS, Performance, Scattering, Semiconductor, Semiconductors, Si, Strained Si, Strained-Si
Status:Published
Refereed:Yes
Glasgow Author(s) Enlighten ID:Barker, Professor John and Watling, Dr Jeremy and Asenov, Professor Asen
Authors: Yang, L., Watling, J., Barker, J., and Asenov, A.
College/School:College of Science and Engineering > School of Engineering > Electronics and Nanoscale Engineering

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