Watling, J., Yang, L., Barker, J. and Asenov, A. (2004) The impact of high-k dielectrics on the future performance of nano-scale MOSFETs. In: IoP Condensed Matter and Materials Physics Conference CMMP04, Warwick, UK,
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| Item Type: | Conference Proceedings |
|---|---|
| Keywords: | Atomistic, Fluctuations, Impact, MOSFET, MOSFETS, Performance, Silicon |
| Status: | Published |
| Refereed: | Yes |
| Glasgow Author(s) Enlighten ID: | Barker, Professor John and Watling, Dr Jeremy and Asenov, Professor Asen |
| Authors: | Watling, J., Yang, L., Barker, J., and Asenov, A. |
| College/School: | College of Science and Engineering > School of Engineering > Electronics and Nanoscale Engineering |
| Publisher: | Institute of Physics |
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