Quantification and characterization of ultrasound-induced polarization wavefront aberration in the phase space

Hou, R., Xia, Z., Zhang, Y., Ni, B., Xu, B., Hou, J., Hou, L. , Liu, X. and Xiong, J. (2024) Quantification and characterization of ultrasound-induced polarization wavefront aberration in the phase space. Applied Optics, 63(3), pp. 624-635. (doi: 10.1364/AO.509621)

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Abstract

Light propagation wavefront and photon composition variations occur when the beam encounters acoustic waves, bringing mechanical and chemical inhomogeneity-induced light-intensity modulation, while phase variations, which carry more information about the acoustic-optical coupling in the medium, are often overlooked. This paper investigates the coupling of the light beam with the propagating ultrasound and the polarization aberration of the optical wave induced by the ultrasound. A model was developed to express the variation of the ultrasound-induced polarization aberration (UIPA). The ultrasound-induced refractive index variation of the sample was observed in both the simulation and experiments. The phase differences in various ultrasound states (valley dominant state, peak dominant state) are characterized in detail. The UIPA expressed in the phase space provides a way to quantify multidimensional polarization information of the ultrasound-tagged optical waves and allows refraction-sensitive polarization parametric imaging, which may be exploited for directional high-contrast photoacoustic imaging with ultrasound tagging.

Item Type:Articles
Additional Information:This work was supported by the National Major Scientific Instruments and Equipment Development Project (No.61827814), Beijing Natural Science Foundation (No. Z190018), the National Natural Science Foundation of China (No. 62105155), the Ministry of Education collaborative project (B17023) and the Natural Science Foundation of Jiangsu Province (BK20210326).
Status:Published
Refereed:Yes
Glasgow Author(s) Enlighten ID:Hou, Dr Lianping
Authors: Hou, R., Xia, Z., Zhang, Y., Ni, B., Xu, B., Hou, J., Hou, L., Liu, X., and Xiong, J.
College/School:College of Science and Engineering > School of Engineering > Electronics and Nanoscale Engineering
Journal Name:Applied Optics
Publisher:Optica Publishing Group
ISSN:1559-128X
ISSN (Online):2155-3165
Published Online:12 January 2024
Copyright Holders:Copyright © 2024 Optica Publishing Group
First Published:First published in Applied Optics 63(3):624-635
Publisher Policy:Reproduced in accordance with the copyright policy of the publisher

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