Cao, X., Thoms, S., Stanley, C. and Thayne, I. (2004) High yield, high uniformity, high performance 50nm T-gate In0.52Al0.48As/In0.7Ga0.3As. In: 7th International Conference on Solid State and Intergrated Circuit Technology, Beijing, China,
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Item Type: | Conference Proceedings |
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Keywords: | High Performance, High-Performance, Performance, Technology |
Status: | Published |
Refereed: | Yes |
Glasgow Author(s) Enlighten ID: | Thayne, Prof Iain and Thoms, Dr Stephen and Stanley, Professor Colin |
Authors: | Cao, X., Thoms, S., Stanley, C., and Thayne, I. |
College/School: | College of Science and Engineering > School of Engineering > Electronics and Nanoscale Engineering |
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