Alexander, C., Brown, A., Watling, J. and Asenov, A. (2004) Impact scattering on random dopant induced current fluctuations in devanano MOSFETs. In: Simulation of Semiconductor Processes and Devices, Munich, Germany, pp. 223-226.
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Item Type: | Conference Proceedings |
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Keywords: | Device, Devices, Fluctuation, Fluctuations, Impact, MOSFET, MOSFETS, Random Dopant, Scattering, Semiconductor, Simulation |
Status: | Published |
Refereed: | Yes |
Glasgow Author(s) Enlighten ID: | Asenov, Professor Asen and Brown, Mr Andrew and Alexander, Dr Craig and Watling, Dr Jeremy |
Authors: | Alexander, C., Brown, A., Watling, J., and Asenov, A. |
College/School: | College of Science and Engineering > School of Engineering > Electronics and Nanoscale Engineering |
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