Adamu-Lema, F., Roy, S., Brown, A., Asenov, A. and Roy, G. (2004) Intrinsic parameter fluctuations in conventional MOSFETs at the scaling limit : a statistical study. In: International workshop on Computational Electronics, IWCE-10, West Lafayette, USA, pp. 44-45.
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| Item Type: | Conference Proceedings |
|---|---|
| Keywords: | Channel, Fluctuation, Fluctuations, Intrinsic Parameter Fluctuation, Intrinsic Parameter Fluctuations, Monte Carlo Simulation, Monte-Carlo-Simulation, MOSFET, MOSFETS, N-MOSFETS, Propagation, Scaling, Simulation, Thickness, Transport |
| Status: | Published |
| Refereed: | Yes |
| Glasgow Author(s) Enlighten ID: | Roy, Dr Gareth and Asenov, Professor Asen and Brown, Mr Andrew and Roy, Professor Scott |
| Authors: | Adamu-Lema, F., Roy, S., Brown, A., Asenov, A., and Roy, G. |
| College/School: | College of Science and Engineering > School of Engineering > Electronics and Nanoscale Engineering |
| Publisher: | IEEE |
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