Intrinsic parameter fluctuations in nanometer scale thin body SOI devices introduced by interface roughness

Brown, A., Adamu-Lema, F. and Asenov, A. (2003) Intrinsic parameter fluctuations in nanometer scale thin body SOI devices introduced by interface roughness. In: NPMS-6/SIMD-4 Sixth International Conference on New Phenomena in Mesoscopic Systems, and Fourth International Conference on Surfaces and Interfaces of Mesoscopic Devices, Maui, Hawaii, Maui, Hawaii, pp. 32-33.

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Item Type:Conference Proceedings
Keywords:Device, Devices, Fluctuation, Fluctuations, Interface, Interface Roughness, Interfaces, Intrinsic Parameter Fluctuation, Intrinsic Parameter Fluctuations, Model, MOSFET, MOSFETS, Noise, Parameter Fluctuations, RTS, Scale, Simulation, Surface, Surfaces, System, Systems
Status:Published
Refereed:Yes
Glasgow Author(s) Enlighten ID:Brown, Mr Andrew and Asenov, Professor Asen
Authors: Brown, A., Adamu-Lema, F., and Asenov, A.
College/School:College of Science and Engineering > School of Engineering > Electronics and Nanoscale Engineering

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