Brown, A., Kaya, S., Asenov, A., Davies, J. and Linton, T. (2001) Statistical 3D simulation of line edge roughness in decanano MOSFETs. In: Silicon Nanoelectronics Workshop, Kyoto, Japan, pp. 10-11.
Full text not currently available from Enlighten.
Item Type: | Conference Proceedings |
---|---|
Keywords: | Decanano MOSFETS, MOSFET, MOSFETS, Silicon, Simulation |
Status: | Published |
Refereed: | Yes |
Glasgow Author(s) Enlighten ID: | Brown, Mr Andrew and Asenov, Professor Asen and Davies, Professor John |
Authors: | Brown, A., Kaya, S., Asenov, A., Davies, J., and Linton, T. |
College/School: | College of Science and Engineering > School of Engineering > Electronics and Nanoscale Engineering |
University Staff: Request a correction | Enlighten Editors: Update this record