Breakdown of universal mobility curves in sub-100nm MOSFETs

Kaya, S., Asenov, A. and Roy, S. (2002) Breakdown of universal mobility curves in sub-100nm MOSFETs. In: Proceedings Silicon Nanoelectronics Workshop 2002, Honolulu,

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Item Type:Conference Proceedings
Keywords:Mobility, MOSFET, MOSFETS, Silicon
Status:Published
Refereed:Yes
Glasgow Author(s) Enlighten ID:Asenov, Professor Asen and Roy, Professor Scott
Authors: Kaya, S., Asenov, A., and Roy, S.
College/School:College of Science and Engineering > School of Engineering > Electronics and Nanoscale Engineering

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