Martinez, A., Kalna, K., Barker, J. and Asenov, A. (2006) A study of the interface roughness effects in Si-nanowires using a full 3D NEGF approach. In: E-MRS IUMRS ICEM 2006, Nice, France, Symposium.
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Item Type: | Conference Proceedings |
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Keywords: | Devices, Interface, Interface Roughness, Simulation |
Status: | Published |
Refereed: | Yes |
Glasgow Author(s) Enlighten ID: | Barker, Professor John and Asenov, Professor Asen and Kalna, Dr Karol and Martinez, Dr Antonio |
Authors: | Martinez, A., Kalna, K., Barker, J., and Asenov, A. |
College/School: | College of Science and Engineering > School of Engineering > Electronics and Nanoscale Engineering |
Publisher: | European Materials Research Society |
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