Longo, P., Scott, J., Hill, R., Moran, D., Craven, A. and Thayne, I. (2006) Elemental mapping of III-V MOSFET structures using energy filtered transmission electron microscopy. In: UK III-V Compound Semiconductors 2006, Sheffield, UK,
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| Item Type: | Conference Proceedings |
|---|---|
| Keywords: | Cells, Compound Semiconductor, Electron, Electron-Microscopy, GAAS, HEMT, III-V MOSFET, Intermediate Band, Losses, Microscopy, MOSFET, MOSFETS, Semiconductor, Semiconductors, Solar Cell, Spectroscopy, System, Systems, Technology, Transmission |
| Status: | Published |
| Refereed: | Yes |
| Glasgow Author(s) Enlighten ID: | Thayne, Prof Iain and Hill, Mr Richard and Moran, Professor David |
| Authors: | Longo, P., Scott, J., Hill, R., Moran, D., Craven, A., and Thayne, I. |
| College/School: | College of Science and Engineering > School of Engineering > Electronics and Nanoscale Engineering |
| Publisher: | IOP/EPSRC |
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