Intrinsic parameter fluctuations due to random grain orientation in the high-k stacks

Brown, A., Watling, J. and Asenov, A. (2006) Intrinsic parameter fluctuations due to random grain orientation in the high-k stacks. In: 11th International Workshop on Computational Electronics, IWCE 2006, Vienna, Austria, p. 49.

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Item Type:Conference Proceedings
Keywords:Fluctuation, Fluctuations, HEMT, High-K, Impact, Interface, Intrinsic Parameter Fluctuation, Intrinsic Parameter Fluctuations, Model, Parameter Fluctuations, Scattering, Simulation, Stacks
Status:Published
Refereed:Yes
Glasgow Author(s) Enlighten ID:Brown, Mr Andrew and Watling, Dr Jeremy and Asenov, Professor Asen
Authors: Brown, A., Watling, J., and Asenov, A.
College/School:College of Science and Engineering > School of Engineering > Electronics and Nanoscale Engineering
Publisher:IEEE

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