RF performance of strained Si MODFETs and MOSFETs on "virtual" SiGe substrates: A Monte Carlo study

Roy, S., Asenov, A., Babiker, S., Barker, J.R. and Beaumont, S.P. (1997) RF performance of strained Si MODFETs and MOSFETs on "virtual" SiGe substrates: A Monte Carlo study. In: European Solid-State Device Research Conference, Stuttgart, Germany, 22-24 September 1997, pp. 192-195. ISBN 2863322214

Abstract

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• Item Type: Conference Proceedings
• Status: Published
• Refereed: Yes
• Glasgow Author(s) Enlighten ID: Beaumont, Professor Steve and Asenov, Professor Asen and Roy, Professor Scott
• Authors: Roy, S., Asenov, A., Babiker, S., Barker, J.R., and Beaumont, S.P.
• Subjects: T Technology > TK Electrical engineering. Electronics Nuclear engineering
• College/School: College of Science and Engineering > School of Engineering > Electronics and Nanoscale Engineering
• Research Group: Device Modelling Group
• Publisher: Institute of Electrical and Electronics Engineers
• ISBN: 2863322214
• Copyright Holders: Copyright © 1997 Institute of Electrical and Electronics Engineers
• First Published: First published in ESSDERC '97 : proceedings of the 27th European Solid-State Device Research Conference (1997):192-195
• Publisher Policy: Reproduced in accordance with the copyright policy of the publisher