Kalna, K., Roy, S., Asenov, A., Elgaid, K. and Thayne, I. (2000) RF analysis of aggressively scaled pHEMTs. In: 30th European Solid-State Device Research Conference., Cork, Ireland, 11-13 September 2000, pp. 156-159. ISBN 2863322486
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rf_analy2_aggscaled.pdf 259kB |
Publisher's URL: http://ieeexplore.ieee.org/xpl/RecentCon.jsp?punumber=10059
Abstract
No abstract avaliable.
Item Type: | Conference Proceedings |
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Status: | Published |
Refereed: | Yes |
Glasgow Author(s) Enlighten ID: | Asenov, Professor Asen and Thayne, Prof Iain and Kalna, Dr Karol and Elgaid, Dr Khaled and Roy, Professor Scott |
Authors: | Kalna, K., Roy, S., Asenov, A., Elgaid, K., and Thayne, I. |
Subjects: | T Technology > TK Electrical engineering. Electronics Nuclear engineering |
College/School: | College of Science and Engineering > School of Engineering > Electronics and Nanoscale Engineering |
Research Group: | Device Modelling Group |
Publisher: | Institute of Electrical and Electronics Engineers |
ISBN: | 2863322486 |
Copyright Holders: | Copyright © 2000 Institute of Electrical and Electronics Engineers |
First Published: | First published in proceedings of the 30th European Solid-State Device Research Conference (2000):159-159 |
Publisher Policy: | Reproduced in accordance with the copyright policy of the publisher |
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