Temperature dependence and physical properties of Ga(NAsP)/GaP semiconductor lasers

Chamings, J., Adams, A.R., Sweeney, S.J. , Kunert, B., Volz, K. and Stolz, W. (2008) Temperature dependence and physical properties of Ga(NAsP)/GaP semiconductor lasers. Applied Physics Letters, 93(10), 101108. (doi: 10.1063/1.2975845)

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Abstract

We report on the properties of GaNAsP/GaP lasers which offer a potential route to producing lasers monolithically on silicon. Lasing has been observed over a wide temperature range with pulsed threshold current density of 2.5 kA/cm2 at 80 K (λ=890 nm)⁠. Temperature dependence measurements show that the radiative component of the threshold is relatively temperature stable while the overall threshold current is temperature sensitive. A sublinear variation of spontaneous emission versus current coupled with a decrease in external quantum efficiency with increasing temperature and an increase in threshold current with hydrostatic pressure implies that a carrier leakage path is the dominant carrier recombination mechanism.

Item Type:Articles
Status:Published
Refereed:Yes
Glasgow Author(s) Enlighten ID:Sweeney, Professor Stephen
Authors: Chamings, J., Adams, A.R., Sweeney, S.J., Kunert, B., Volz, K., and Stolz, W.
College/School:College of Science and Engineering > School of Engineering > Electronics and Nanoscale Engineering
Journal Name:Applied Physics Letters
Publisher:American Institute of Physics
ISSN:0003-6951
ISSN (Online):1077-3118
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