Sarcan, F. et al. (2023) Understanding the impact of heavy ions and tailoring the optical properties of large-area monolayer WS 2 using focused ion beam. npj 2D Materials and Applications, 7(1), 23. (doi: 10.1038/s41699-023-00386-0)
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Abstract
Focused ion beam (FIB) is an effective tool for precise nanoscale fabrication. It has recently been employed to tailor defect engineering in functional nanomaterials such as two-dimensional transition metal dichalcogenides (TMDCs), providing desirable properties in TMDC-based optoelectronic devices. However, the damage caused by the FIB irradiation and milling process to these delicate, atomically thin materials, especially in extended areas beyond the FIB target, has not yet been fully characterised. Understanding the correlation between lateral ion beam effects and optical properties of 2D TMDCs is crucial in designing and fabricating high-performance optoelectronic devices. In this work, we investigate lateral damage in large-area monolayer WS2 caused by the gallium focused ion beam milling process. Three distinct zones away from the milling location are identified and characterised via steady-state photoluminescence (PL) and Raman spectroscopy. The emission in these three zones have different wavelengths and decay lifetimes. An unexpected bright ring-shaped emission around the milled location has also been revealed by time-resolved PL spectroscopy with high spatial resolution. Our findings open up new avenues for tailoring the optical properties of TMDCs by charge and defect engineering via focused ion beam lithography. Furthermore, our study provides evidence that while some localised damage is inevitable, distant destruction can be eliminated by reducing the ion beam current. It paves the way for the use of FIB to create nanostructures in 2D TMDCs, as well as the design and realisation of optoelectrical devices on a wafer scale.
| Item Type: | Articles |
|---|---|
| Additional Information: | Y.W. acknowledges a Research Fellowship (TOAST, RF\201718\17131) awarded by the Royal Academy of Engineering. F.S. gratefully acknowledges the support from the Scientific Research Projects Coordination Unit of Istanbul University (FUA-2018-32983) and The Scientific and Technological Research Council of Turkey (TUBITAK) project (121F169). P.Z., T.S.-M., D.J.G. and A.I.T. acknowledge the European Graphene Flagship Project (881603) and EPSRC (EP/S030751/1 and EP/V006975/1). G.J.H. acknowledges EPSRC (EP/V004921/1 and EP/V048805/1). |
| Status: | Published |
| Refereed: | Yes |
| Glasgow Author(s) Enlighten ID: | Hedley, Dr Gordon and Fairbairn, Miss Nicola |
| Authors: | Sarcan, F., Fairbairn, N. J., Zotev, P., Severs-Millard, T., Gillard, D. J., Wang, X., Conran, B., Heuken, M., Erol, A., Tartakovskii, A. I., Krauss, T. F., Hedley, G. J., and Wang, Y. |
| College/School: | College of Science and Engineering > School of Chemistry |
| Journal Name: | npj 2D Materials and Applications |
| Publisher: | Nature Research |
| ISSN: | 2397-7132 |
| ISSN (Online): | 2397-7132 |
| Copyright Holders: | Copyright © The Author(s) 2023 |
| First Published: | First published in npj 2D Materials and Applications 7(1):23 |
| Publisher Policy: | Reproduced under a Creative Commons license |
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