Sobhani, S. A., Hogg, R. A. , Takemasa, K., Nishi, K., Sugawara, M. and Childs, D. T.D. (2023) Systematic study of external optical feedback tolerance in 1300 nm quantum dot lasers. IEEE Journal of Quantum Electronics, 59(1), pp. 1-8. (doi: 10.1109/jqe.2022.3162026)
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Abstract
Resilience of 1300nm In(Ga)As/GaAs quantum dot lasers to external optical feedback is systematically investigated from − 10°C to 85 °C. The high-resolution spectral and current-dependent linewidth enhancement factor is measured for all modes in the positive net modal gain region. Complimentary to that, analysis of the free-running and under deployment specific feedback relative intensity noise is discussed in the context of compliance against the IEEE 802.3ah specifications at the full range of temperatures.
| Item Type: | Articles |
|---|---|
| Status: | Published |
| Refereed: | Yes |
| Glasgow Author(s) Enlighten ID: | Hogg, Professor Richard and Childs, Dr David |
| Authors: | Sobhani, S. A., Hogg, R. A., Takemasa, K., Nishi, K., Sugawara, M., and Childs, D. T.D. |
| College/School: | College of Science and Engineering > School of Engineering College of Science and Engineering > School of Engineering > Electronics and Nanoscale Engineering |
| Journal Name: | IEEE Journal of Quantum Electronics |
| Publisher: | IEEE |
| ISSN: | 0018-9197 |
| ISSN (Online): | 1558-1713 |
| Published Online: | 29 March 2022 |
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