Sun, C.-L., Lam, K. H. , Chao, C., Lau, S. T., Chan, H. L. W., Guo, S. and Zhao, X. (2007) Fabrication and characterization of Ni/P(VDF-TrFE) nanoscaled coaxial cables. Applied Physics Letters, 90(25), 253107. (doi: 10.1063/1.2750391)
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Abstract
The authors have prepared poly(vinylidenefluoride-trifluoroethylene) Ni/P(VDF-TrFE) nanoscaled coaxial cables with Ni nanowires as the cores and P(VDF-TrFE) nanotubes as the shells by a two-step process. Scanning electron microscope and x-ray diffraction measurements revealed the microstructure and crystallinity of the nanocables. Electrical measurements indicated that the nanocables possessed a large specific capacitance (~10.84pC/mm2) and ferroelectric remnant polarization (~10μC/cm2) due to the composite structure. The distribution of electrical field in the nanostructure was also analyzed.
| Item Type: | Articles |
|---|---|
| Status: | Published |
| Refereed: | Yes |
| Glasgow Author(s) Enlighten ID: | Lam, Dr Koko |
| Authors: | Sun, C.-L., Lam, K. H., Chao, C., Lau, S. T., Chan, H. L. W., Guo, S., and Zhao, X. |
| College/School: | College of Science and Engineering > School of Engineering > Systems Power and Energy |
| Journal Name: | Applied Physics Letters |
| Publisher: | American Institute of Physics |
| ISSN: | 0003-6951 |
| ISSN (Online): | 1077-3118 |
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