MacKenzie, M., Craven, A.J., Nicholson, W.A.P. and Hatto, P. (2002) Analytical electron microscopy interface layers between Ti(6% Al, 4% V) and a CrN cathodic arc coating. Journal of Physics D: Applied Physics, 35, pp. 779-787.
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| Item Type: | Articles |
|---|---|
| Status: | Published |
| Refereed: | Yes |
| Glasgow Author(s) Enlighten ID: | Nicholson, Dr Patrick and Craven, Professor Alan |
| Authors: | MacKenzie, M., Craven, A.J., Nicholson, W.A.P., and Hatto, P. |
| College/School: | College of Science and Engineering > School of Physics and Astronomy |
| Journal Name: | Journal of Physics D: Applied Physics |
| ISSN: | 0022-3727 |
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