Dione: an Integrated Measurement and Defect Prediction Solution

Caglayan, B., Misirli, A. T., Calikli, G. , Bener, A., Aytac, T. and Turhan, B. (2012) Dione: an Integrated Measurement and Defect Prediction Solution. In: ACM SIGSOFT 20th International Symposium on the Foundations of Software Engineering (FSE '12), Cary, NC, USA, 11-16 Nov 2012, p. 20. ISBN 9781450316149 (doi: 10.1145/2393596.2393619)

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We present an integrated measurement and defect prediction tool: Dione. Our tool enables organizations to measure, monitor, and control product quality through learning based defect prediction. Similar existing tools either provide data collection and analytics, or work just as a prediction engine. Therefore, companies need to deal with multiple tools with incompatible interfaces in order to deploy a complete measurement and prediction solution. Dione provides a fully integrated solution where data extraction, defect prediction and reporting steps fit seamlessly. In this paper, we present the major functionality and architectural elements of Dione followed by an overview of our demonstration.

Item Type:Conference Proceedings
Glasgow Author(s) Enlighten ID:Calikli, Dr Handan Gul
Authors: Caglayan, B., Misirli, A. T., Calikli, G., Bener, A., Aytac, T., and Turhan, B.
College/School:College of Science and Engineering > School of Computing Science

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