Nanoscale optical electrometer

Vamivakas, A.N., Zhao, Y., Fält, S., Badolato, A. , Taylor, J.M. and Atatüre, M. (2011) Nanoscale optical electrometer. Physical Review Letters, 107(16), 166802. (doi: 10.1103/PhysRevLett.107.166802)

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We propose and demonstrate an all-optical approach to single-electron sensing using the optical transitions of a semiconductor quantum dot. The measured electric-field sensitivity of 5     ( V / m ) / √ Hz corresponds to detecting a single electron located 5     μ m from the quantum dot—nearly 10 times greater than the diffraction limited spot size of the excitation laser—in 1 s. The quantum-dot-based electrometer is more sensitive than other devices operating at a temperature of 4.2 K or higher and further offers suppressed backaction on the measured system.

Item Type:Articles
Glasgow Author(s) Enlighten ID:Badolato, Professor Antonio
Authors: Vamivakas, A.N., Zhao, Y., Fält, S., Badolato, A., Taylor, J.M., and Atatüre, M.
College/School:College of Science and Engineering > School of Engineering > Electronics and Nanoscale Engineering
Journal Name:Physical Review Letters
Publisher:American Physical Society
ISSN (Online):1079-7114
Published Online:11 October 2011

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