Vamivakas, A.N., Zhao, Y., Fält, S., Badolato, A. , Taylor, J.M. and Atatüre, M. (2011) Nanoscale optical electrometer. Physical Review Letters, 107(16), 166802. (doi: 10.1103/PhysRevLett.107.166802)
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Abstract
We propose and demonstrate an all-optical approach to single-electron sensing using the optical transitions of a semiconductor quantum dot. The measured electric-field sensitivity of 5 ( V / m ) / √ Hz corresponds to detecting a single electron located 5 μ m from the quantum dot—nearly 10 times greater than the diffraction limited spot size of the excitation laser—in 1 s. The quantum-dot-based electrometer is more sensitive than other devices operating at a temperature of 4.2 K or higher and further offers suppressed backaction on the measured system.
Item Type: | Articles |
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Status: | Published |
Refereed: | Yes |
Glasgow Author(s) Enlighten ID: | Badolato, Professor Antonio |
Authors: | Vamivakas, A.N., Zhao, Y., Fält, S., Badolato, A., Taylor, J.M., and Atatüre, M. |
College/School: | College of Science and Engineering > School of Engineering > Electronics and Nanoscale Engineering |
Journal Name: | Physical Review Letters |
Publisher: | American Physical Society |
ISSN: | 0031-9007 |
ISSN (Online): | 1079-7114 |
Published Online: | 11 October 2011 |
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