Static force characterization with Fano anti-resonance in levitated optomechanics

Timberlake, C., Toroš, M. , Hempston, D., Winstone, G., Rashid, M. and Ulbricht, H. (2019) Static force characterization with Fano anti-resonance in levitated optomechanics. Applied Physics Letters, 114(2), 023104. (doi: 10.1063/1.5081045)

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Abstract

We demonstrate a classical analogy to the Fano anti-resonance in levitated optomechanics by applying a DC electric field. Specifically, we experimentally tune the Fano parameter by applying a DC voltage from 0 kV to 10 kV on a nearby charged needle tip. We find consistent results across negative and positive needle voltages, with the Fano line-shape feature able to exist at both higher and lower frequencies than the fundamental oscillator frequency. We can use the Fano parameter to characterize our system to be sensitive to static interactions which are ever-present. Currently, we can distinguish a static Coulomb force of 2.7 ± 0.5 × 10−15 N with the Fano parameter, which is measured with 1 s of integration time. Furthermore, we are able to extract the charge to mass ratio of the trapped nanoparticle.

Item Type:Articles
Status:Published
Refereed:Yes
Glasgow Author(s) Enlighten ID:Toros, Dr Marko
Authors: Timberlake, C., Toroš, M., Hempston, D., Winstone, G., Rashid, M., and Ulbricht, H.
College/School:College of Science and Engineering > School of Physics and Astronomy
Journal Name:Applied Physics Letters
Publisher:AIP Publishing
ISSN:0003-6951
ISSN (Online):1077-3118
Published Online:16 January 2019
Data DOI:10.5258/SOTON/D0713

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