Fast pixelated detectors in scanning transmission electron microscopy. Part II: post acquisition data processing, visualisation, and structural characterisation

Paterson, G. W. , Webster, R. W.H., Ross, A., Paton, K. A. , Macgregor, T. A., McGrouther, D. , MacLaren, I. and Nord, M. (2020) Fast pixelated detectors in scanning transmission electron microscopy. Part II: post acquisition data processing, visualisation, and structural characterisation. Microscopy and Microanalysis, 26(5), pp. 944-963. (doi: 10.1017/S1431927620024307) (PMID:32883393)

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Abstract

Fast pixelated detectors incorporating direct electron detection (DED) technology are increasingly being regarded as universal detectors for scanning transmission electron microscopy (STEM), capable of imaging under multiple modes of operation. However, several issues remain around the post acquisition processing and visualisation of the often very large multidimensional STEM datasets produced by them. We discuss these issues and present open source software libraries to enable efficient processing and visualisation of such datasets. Throughout, we provide examples of the analysis methodologies presented, utilising data from a 256×256 pixel Medipix3 hybrid DED detector, with a particular focus on the STEM characterisation of the structural properties of materials. These include the techniques of virtual detector imaging; higher order Laue zone analysis; nanobeam electron diffraction; and scanning precession electron diffraction. In the latter, we demonstrate nanoscale lattice parameter mapping with a fractional precision ≤6×10−4 (0.06%).

Item Type:Articles
Status:Published
Refereed:Yes
Glasgow Author(s) Enlighten ID:McGrouther, Dr Damien and Paton, Ms Kirsty and Webster, Robert and Macgregor, Thomas and Paterson, Dr Gary and Nord, Dr Magnus and MacLaren, Dr Ian
Authors: Paterson, G. W., Webster, R. W.H., Ross, A., Paton, K. A., Macgregor, T. A., McGrouther, D., MacLaren, I., and Nord, M.
College/School:College of Science and Engineering > School of Physics and Astronomy
Journal Name:Microscopy and Microanalysis
Publisher:Published for the Microscopy Society of America by Cambridge University Press
ISSN:1431-9276
ISSN (Online):1435-8115
Published Online:04 September 2020
Copyright Holders:Copyright © 2020 The Authors
First Published:First published in Microscopy and Microanalysis 26(5):944-963
Publisher Policy:Reproduced under a Creative Commons licence
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Project CodeAward NoProject NamePrincipal InvestigatorFunder's NameFunder RefLead Dept
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