Less Expensive and High Quality Stopping Criteria for MC-based Analog IC Yield Optimization

Liu, B. , Fernández, F. V., De Jonghe, D. and Gielen, G. (2009) Less Expensive and High Quality Stopping Criteria for MC-based Analog IC Yield Optimization. In: 2009 16th IEEE International Conference on Electronics, Circuits and Systems (ICECS 2009), Yasmine Hammamet, Tunisia, 13-16 Dec 2009, pp. 267-270. ISBN 9781424450909 (doi: 10.1109/ICECS.2009.5410991)

Abstract

This paper investigates the stopping criteria for Monte-Carlo (MC)-based yield optimization of analog integrated circuits. Available stopping criteria are briefly reviewed and a new adaptive criterion, called combined global and local improvement (ComImp) is presented. Experimental results show that the proposed stopping criterion has the following two advantages: (1) low risk of early termination before the optimum has been reached with the desired accuracy; (2) less additional function evaluations after the convergence has already been reached.

• Item Type: Conference Proceedings
• Status: Published
• Refereed: Yes
• Glasgow Author(s) Enlighten ID: Liu, Professor Bo
• Authors: Liu, B., Fernández, F. V., De Jonghe, D., and Gielen, G.
• College/School: College of Science and Engineering > School of Engineering
• ISBN: 9781424450909