Kuzmenko, K. et al. (2020) 3D LIDAR imaging using Ge-on-Si single–photon avalanche diode detectors. Optics Express, 28(2), pp. 1330-1344. (doi: 10.1364/OE.383243)
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Abstract
We present a scanning light detection and ranging (LIDAR) system incorporating an individual Ge-on-Si single-photon avalanche diode (SPAD) detector for depth and intensity imaging in the short-wavelength infrared region. The time-correlated single-photon counting technique was used to determine the return photon time-of-flight for target depth information. In laboratory demonstrations, depth and intensity reconstructions were made of targets at short range, using advanced image processing algorithms tailored for the analysis of single–photon time-of-flight data. These laboratory measurements were used to predict the performance of the single-photon LIDAR system at longer ranges, providing estimations that sub-milliwatt average power levels would be required for kilometer range depth measurements.
Item Type: | Articles |
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Additional Information: | Funding: Engineering and Physical Sciences Research Council (EP/N003225/1, EP/K015338/1, EP/L024020/1, EP/M01326X/1, EP/N003446/1); Royal Academy of Engineering (RF/201718/17128, RF/201819/18/187). |
Status: | Published |
Refereed: | Yes |
Glasgow Author(s) Enlighten ID: | Mirza, Dr Muhammad M A and Millar, Dr Ross and Paul, Professor Douglas and Dumas, Dr Derek and Ferre Llin, Dr Lourdes and Kirdoda, Mr Jaroslaw |
Authors: | Kuzmenko, K., Vines, P., Halimi, A., Collins, R. J., Maccarone, A., McCarthy, A., Greener, Z. M., Kirdoda, J., Dumas, D. C.S., Ferre Llin, L., Mirza, M. M., Millar, R. W., Paul, D. J., and Buller, G. S. |
College/School: | College of Science and Engineering > School of Engineering > Electronics and Nanoscale Engineering |
Journal Name: | Optics Express |
Publisher: | Optical Society of America |
ISSN: | 1094-4087 |
ISSN (Online): | 1094-4087 |
Published Online: | 08 January 2020 |
Copyright Holders: | Copyright © 2020 The Optical Society |
First Published: | First published in Optics Express 28(2): 1330-1344 |
Publisher Policy: | Reproduced under a Creative Commons License |
Data DOI: | 10.17861/f4f42c63-c6f6-4986-a69b-9e443f945fe9 |
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