Xiang, H.-F., Xu, Z.-X., Roy, V.A.L. , Che, C.-M. and Lai, P.T. (2007) Method for measurement of the density of thin films of small organic molecules. Review of Scientific Instruments, 78(3), 034104. (doi: 10.1063/1.2712932)
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Abstract
An accurate and sensitive method is reported to measure the thin-film density of vacuum-deposited, small-molecular organic semiconductor materials. A spectrophotometer and surface profiler had been used to determine the mass and thickness of organic thin film, respectively. The calculated density of tris-(8-hydroxyquinolato) aluminum (Alq3) thin film was 1.31±0.01 g/cm3. Vacuum pressures and thin-film growth rates are found to have less impact on the thin-film density of organic material. However, the thin-film density of organic material strongly depends on its chemical structure and molecular weight. Specifically, the chemical structure determines the density of organic material that affects the molecular volume and intermolecular stacking.
| Item Type: | Articles |
|---|---|
| Status: | Published |
| Refereed: | Yes |
| Glasgow Author(s) Enlighten ID: | Vellaisamy, Professor Roy |
| Authors: | Xiang, H.-F., Xu, Z.-X., Roy, V.A.L., Che, C.-M., and Lai, P.T. |
| College/School: | College of Science and Engineering > School of Engineering |
| Journal Name: | Review of Scientific Instruments |
| Publisher: | AIP Publishing |
| ISSN: | 0034-6748 |
| ISSN (Online): | 1089-7623 |
| Published Online: | 21 March 2007 |
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