Maximum-likelihood Localization of Overlapping Point Sources in 3D Microscopy Using CLEAN

Handley, M., Carles, G. and Harvey, A. R. (2019) Maximum-likelihood Localization of Overlapping Point Sources in 3D Microscopy Using CLEAN. In: Computational Optical Sensing and Imaging 2019, Munich, Germany, 24-27 Jun 2019, JW2A.18. ISBN 9781943580637 (doi: 10.1364/COSI.2019.JW2A.18)

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Abstract

Precise 3D point localization is increasingly important in microscopy, but algorithms break down when PSFs overlap. We adapt the CLEAN algorithm from astronomical imaging to enable MLE localization of high-density datasets.

Item Type:Conference Proceedings
Status:Published
Refereed:Yes
Glasgow Author(s) Enlighten ID:Handley, Mr Michael and Carles Santacana, Dr Guillem and Harvey, Professor Andy
Authors: Handley, M., Carles, G., and Harvey, A. R.
College/School:College of Science and Engineering > School of Physics and Astronomy
ISBN:9781943580637
Copyright Holders:Copyright © 2019 OSA
Publisher Policy:Reproduced in accordance with the copyright policy of the publisher

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