Griskeviciute, U., Gallacher, K. , Millar, R. W. , Paul, D. J. and MacGilp, I. (2019) Understanding the Sidewall Dependence of Loss for Ge-on-Si Waveguides in the Mid-Infrared. In: 2019 IEEE 16th International Conference on Group IV Photonics (GFP), Singapore, 28-30 Aug 2019, ISBN 9781728109053 (doi: 10.1109/GROUP4.2019.8853945)
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Abstract
Measurements of sidewall roughness by atomic force microscopy has been used to understand the waveguides losses of Ge-on-Si mid-infrared rib waveguides. Simulations indicate the measured roughness is well below values corresponding to the measured losses indicating sidewall roughness scattering is not the dominant loss mechanism.
Item Type: | Conference Proceedings |
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Status: | Published |
Refereed: | Yes |
Glasgow Author(s) Enlighten ID: | Macgilp, Mr Iain and Millar, Dr Ross and Hawley, Mrs Ugne and Paul, Professor Douglas and Gallacher, Dr Kevin |
Authors: | Griskeviciute, U., Gallacher, K., Millar, R. W., Paul, D. J., and MacGilp, I. |
College/School: | College of Science and Engineering > School of Engineering > Electronics and Nanoscale Engineering |
ISSN: | 1949-209X |
ISBN: | 9781728109053 |
Copyright Holders: | Copyright © 2019 The Authors |
Publisher Policy: | Reproduced in accordance with the copyright policy of the publisher |
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