Sengupta, A. and Mahapatra, S. (2013) Negative differential resistance and effect of defects and deformations in MoS2 armchair nanoribbon metal-oxide-semiconductor field effect transistor. Journal of Applied Physics, 114(19), p. 194513. (doi: 10.1063/1.4833554)
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Abstract
In this work, we present a study on the negative differential resistance (NDR) behavior and the impact of various deformations (like ripple, twist, wrap) and defects like vacancies and edge roughness on the electronic properties of short-channel MoS2 armchair nanoribbon MOSFETs. The effect of deformation (3°–7° twist or wrap and 0.3–0.7 Å ripple amplitude) and defects on a 10 nm MoS2 ANR FET is evaluated by the density functional tight binding theory and the non-equilibrium Green`s function approach. We study the channel density of states, transmission spectra, and the ID–VD characteristics of such devices under the varying conditions, with focus on the NDR behavior. Our results show significant change in the NDR peak to valley ratio and the NDR window with such minor intrinsic deformations, especially with the ripple.
| Item Type: | Articles |
|---|---|
| Status: | Published |
| Refereed: | Yes |
| Glasgow Author(s) Enlighten ID: | Sengupta, Dr Amretashis |
| Authors: | Sengupta, A., and Mahapatra, S. |
| College/School: | College of Science and Engineering > School of Engineering > Systems Power and Energy |
| Journal Name: | Journal of Applied Physics |
| Publisher: | AIP Publishing |
| ISSN: | 0021-8979 |
| ISSN (Online): | 1089-7550 |
| Published Online: | 21 November 2013 |
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