Craven, A.J. (2004) Perspectives in nanoanalysis. In: Proceedings of the Institute of Physics Electron Microscopy and Analysis Group Conference, University of Oxford, 3-5 September 2003, pp. 285-290.
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Abstract
Advances in aberration correction, parallel detection, spectrum imaging and modelling have revolutionised nanoanalysis to the point where real systems containing both light and heavy elements can be analysed at true atomic resolution and approaching single atom sensitivity.
| Item Type: | Conference Proceedings |
|---|---|
| Status: | Published |
| Refereed: | Yes |
| Glasgow Author(s) Enlighten ID: | Craven, Professor Alan |
| Authors: | Craven, A.J. |
| Subjects: | Q Science > QC Physics |
| College/School: | College of Science and Engineering > School of Physics and Astronomy |
| ISSN: | 0750309679 |
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