Focused Electron-Beam Induced Deposition, In Situ TEM And Off-Axis Electron Holography Investigation of Bi-Magnetic Core-Shell Nanostructures

Almeida, T. P. , McGrouther, D. , Kovács, A., Dunin-Borkowski, R. E. and McVitie, S. (2019) Focused Electron-Beam Induced Deposition, In Situ TEM And Off-Axis Electron Holography Investigation of Bi-Magnetic Core-Shell Nanostructures. Atom Probe Tomography and Microscopy (APT&M 2018), Gaithersburg, MD, USA, 10-15 Jun 2018. (doi:10.1017/S1431927619001016)

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Abstract

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Item Type:Conference or Workshop Item
Status:Published
Refereed:No
Glasgow Author(s) Enlighten ID:McGrouther, Dr Damien and McVitie, Professor Stephen and Almeida, Dr Trevor
Authors: Almeida, T. P., McGrouther, D., Kovács, A., Dunin-Borkowski, R. E., and McVitie, S.
Subjects:Q Science > QC Physics
College/School:College of Science and Engineering > School of Physics and Astronomy
ISSN:1431-9276
Published Online:04 August 2019
Copyright Holders:Copyright © 2019 Microscopy Society of America
First Published:First published in Microscopy and Microanalysis 25(S2): 56-57
Publisher Policy:Reproduced in accordance with the publisher copyright policy

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