Gallacher, K. , Millar, R. W. , Griskevivuite, U., Baldassarre, L., Sorel, M. , Ortolani, M. and Paul, D. J. (2019) TuA4.1 - Mid-infrared Sensing with Ge on Si Waveguides (Invited). In: 2019 IEEE Photonics Society Summer Topical Meeting Series (SUM), Ft. Lauderdale, FL, USA, 08-10 Jul 2019, ISBN 9781728105970 (doi: 10.1109/PHOSST.2019.8795039)
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193484.pdf - Accepted Version 475kB |
Abstract
Ge-on-Si waveguides with losses below 5 dB/cm across 7.5 to 11 µm wavelength are demonstrated. Sidewall etch roughness was measured using atomic force microscopy to investi- gate the waveguide loss mechanisms. Mid-infrared spectroscopy of poly(methyl methacrylate) was demonstrated using the Ge waveguides for mid-infrared sensing.
| Item Type: | Conference Proceedings |
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| Status: | Published |
| Refereed: | Yes |
| Glasgow Author(s) Enlighten ID: | Millar, Dr Ross and Sorel, Professor Marc and Hawley, Mrs Ugne and Paul, Professor Douglas and Gallacher, Dr Kevin |
| Authors: | Gallacher, K., Millar, R. W., Griskevivuite, U., Baldassarre, L., Sorel, M., Ortolani, M., and Paul, D. J. |
| College/School: | College of Science and Engineering > School of Engineering > Electronics and Nanoscale Engineering |
| ISSN: | 2376-8614 |
| ISBN: | 9781728105970 |
| Published Online: | 15 August 2019 |
| Copyright Holders: | Copyright © 2019 IEEE |
| First Published: | First published in 2019 IEEE Photonics Society Summer Topical Meeting Series (SUM) |
| Publisher Policy: | Reproduced in accordance with the publisher copyright policy |
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