Norman, C. E., Griffin, N., Arnone, D.D., Paul, D.J. , Pepper, M., Gallas, B. and Fernandez, J.M. (1998) EBIC of Strained Si/SiGe 2DEGs Showing Lateral Electron Confinement. 5th International Workshop on Beam Injection Assessment of Defects in Semiconductors (BIADS 98) pp. 25-32. (doi: 10.4028/www.scientific.net/SSP.63-64.25)
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Abstract
No abstract available.
Item Type: | Conference or Workshop Item |
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Status: | Published |
Refereed: | Yes |
Glasgow Author(s) Enlighten ID: | Paul, Professor Douglas |
Authors: | Norman, C. E., Griffin, N., Arnone, D.D., Paul, D.J., Pepper, M., Gallas, B., and Fernandez, J.M. |
College/School: | College of Science and Engineering > School of Engineering > Electronics and Nanoscale Engineering |
Research Group: | Semiconductor Devices |
Publisher: | Trans Tech Publications |
Published Online: | 01 December 1998 |
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