Pump-probe measurement of lifetime engineering in far-infrared SiGe quantum wells

Pidgeon, C.R., Phillips, P.J., Carder, D., Murdin, B.N., Fromherz, T. and Paul, D.J. (2006) Pump-probe measurement of lifetime engineering in far-infrared SiGe quantum wells. Institute of Physics Conference Series, 187, pp. 203-208.

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Abstract

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Item Type:Articles
Status:Published
Refereed:Yes
Glasgow Author(s) Enlighten ID:Paul, Professor Douglas
Authors: Pidgeon, C.R., Phillips, P.J., Carder, D., Murdin, B.N., Fromherz, T., and Paul, D.J.
College/School:College of Science and Engineering > School of Engineering > Electronics and Nanoscale Engineering
Research Group:Semiconductor Devices
Journal Name:Institute of Physics Conference Series
Publisher:IOP Publishing
ISSN:0305-2346

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