Pidgeon, C.R., Phillips, P.J., Carder, D., Murdin, B.N., Fromherz, T. and Paul, D.J. (2006) Pump-probe measurement of lifetime engineering in far-infrared SiGe quantum wells. Institute of Physics Conference Series, 187, pp. 203-208.
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Abstract
No abstract available.
Item Type: | Articles |
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Status: | Published |
Refereed: | Yes |
Glasgow Author(s) Enlighten ID: | Paul, Professor Douglas |
Authors: | Pidgeon, C.R., Phillips, P.J., Carder, D., Murdin, B.N., Fromherz, T., and Paul, D.J. |
College/School: | College of Science and Engineering > School of Engineering > Electronics and Nanoscale Engineering |
Research Group: | Semiconductor Devices |
Journal Name: | Institute of Physics Conference Series |
Publisher: | IOP Publishing |
ISSN: | 0305-2346 |
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