McDougall, S.D., Kowalski, O.P., Bryce, A.C., Marsh, J.H. and Ironside, C.N. (1997) Extended cavity ridge waveguide lasers operating at 1.5 [micro sign]m using a simple damage induced quantum well intermixing process. Electronics Letters, 33(23), pp. 1957-1958. (doi: 10.1049/el:19971310)
Full text not currently available from Enlighten.
Abstract
The authors report extended cavity ridge waveguide lasers in InGaAs-InGaAsP, intermixed by damage induced via a silica sputtering process, with selective intermixing achieved through photoresist masking. Laser threshold currents indicate passive waveguide losses of 4.4 cm/sup -1/.
Item Type: | Articles |
---|---|
Status: | Published |
Refereed: | Yes |
Glasgow Author(s) Enlighten ID: | Ironside, Professor Charles and Marsh, Professor John |
Authors: | McDougall, S.D., Kowalski, O.P., Bryce, A.C., Marsh, J.H., and Ironside, C.N. |
College/School: | College of Science and Engineering > School of Engineering > Electronics and Nanoscale Engineering |
Journal Name: | Electronics Letters |
Publisher: | Institution of Engineering & Technology |
ISSN: | 0013-5194 |
ISSN (Online): | 1350-911X |
University Staff: Request a correction | Enlighten Editors: Update this record