Analytical electron microscopy of interface layers between Ti(6% Al, 4% V) and a CrN cathodic arc coating

MacKenzie, M., Craven, A.J., Nicholson, W.A.P. and Hatto, P. (2002) Analytical electron microscopy of interface layers between Ti(6% Al, 4% V) and a CrN cathodic arc coating. Journal of Physics D: Applied Physics, 35(8), 779 -787. (doi: 10.1088/0022-3727/35/8/309)

Abstract

This paper reports on the applications of analytical electron microscopy to the study of cathodic arc deposited CrN coating on a Ti(6% Al, 4% V) substrate. Particular attention is given to analysis of the coating/substrate interface. Electron energy loss spectroscopy is used to show that the Cr sputter cleaning of the Ti(6% Al, 4% V) results in penetration of Cr into the substrate giving a bcc alloy layer whose composition varies from Ti(6% Al, 4% V) at the substrate interface to almost pure Cr at the coating interface. Subsequent deposition of CrN results in an initial deposition of sub-stoichiometric Cr₂N followed by sub-stoichiometric CrN with a {022} texture and a columnar structure. The degree of sub-stoichiometry of the nitrides depends on the substrate bias and the substrate orientation relative to the cathode.

• Item Type: Articles
• Status: Published
• Refereed: Yes
• Glasgow Author(s) Enlighten ID: MacKenzie, Dr Maureen and Craven, Professor Alan
• Authors: MacKenzie, M., Craven, A.J., Nicholson, W.A.P., and Hatto, P.
• Subjects: Q Science > QC Physics
• College/School: College of Science and Engineering > School of Physics and Astronomy
• Journal Name: Journal of Physics D: Applied Physics
• ISSN: 0022-3727