Ridler, N. and Li, C. (2017) Benchmarking Electrical Loss in Rectangular Metallic Waveguide at Submillimeter Wavelengths. In: 2017 10th UK-Europe-China Workshop on Milimetre Waves and Terahertz Technologies (UCMMT), Liverpool, UK, 11-13 Sep 2017, ISBN 9781538627204 (doi: 10.1109/UCMMT.2017.8068355)
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Abstract
A series of documentary standards has recently been published (the IEEE 1785 series) that provides specification details for rectangular metallic waveguides used at frequencies from 110 GHz to at least 3.3 THz. This includes values of electrical loss (both reflection and transmission) for these waveguides. However, the values specified in these standards are based on calculated (i.e. modelled) performance and not measured values for real waveguide devices. This paper presents measured values of loss for commercially available waveguides in this frequency range. A comparison is given between the standardized values and values obtained from measurements made under precision laboratory conditions.
Item Type: | Conference Proceedings |
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Additional Information: | This work was funded by the 2017-2020 National Measurement System Programme of the UK government’s Department for Business, Energy & Industrial Strategy (BEIS). |
Status: | Published |
Refereed: | Yes |
Glasgow Author(s) Enlighten ID: | Li, Professor Chong |
Authors: | Ridler, N., and Li, C. |
College/School: | College of Science and Engineering > School of Engineering > Electronics and Nanoscale Engineering |
Research Group: | MaTE |
ISBN: | 9781538627204 |
Published Online: | 16 October 2017 |
Copyright Holders: | Copyright © 2017 Crown |
First Published: | First published in 2017 10th UK-Europe-China Workshop on Milimetre Waves and Terahertz Technologies (UCMMT) |
Publisher Policy: | Reproduced in accordance with the publisher copyright policy |
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