Development of a Verification Technique for On-wafer Noise Figure Measurement Systems

Wu, A., Li, C. , Sun, J., Wang, Y. and Liu, C. (2018) Development of a Verification Technique for On-wafer Noise Figure Measurement Systems. In: 2017 90th ARFTC Microwave Measurement Symposium (ARFTG), Boulder, CO, USA, 28 Nov - 01 Dec 2017, ISBN 9781538643563 (doi: 10.1109/ARFTG.2017.8255878)

Abstract

We present the development of a verification technique for on-wafer noise figure (NF) measurement systems. As the key element of the technique, a verification device consisting of a mismatched attenuator and a low noise amplifier (LNA) has been developed. The attenuator and the LNA are fabricated on two separate chips but joined with a bondwire. The verification procedure based on the device has also been developed and tested on an on-wafer vector network analyzer system with a noise measurement option across the frequency range from 2 GHz to 20 GHz. It has also been found that the bondwire contributes to negligible effect on the system when NF is high e.g. 3 dB but slightly higher when NF is smaller e.g. 1 dB.

• Item Type: Conference Proceedings
• Status: Published
• Refereed: Yes
• Glasgow Author(s) Enlighten ID: Li, Professor Chong
• Authors: Wu, A., Li, C., Sun, J., Wang, Y., and Liu, C.
• College/School: College of Science and Engineering > School of Engineering > Electronics and Nanoscale Engineering
• Research Group: MaTE
• ISBN: 9781538643563
• Published Online: 15 January 2018
• Copyright Holders: Copyright © 2017 IEEE
• First Published: First published in 2017 90th ARFTC Microwave Measurement Symposium (ARFTG)
• Publisher Policy: Reproduced in accordance with the publisher copyright policy