Tillmann, K., Thust, A., Gerber, A., Weides, M. P. and Urban, K. (2005) Atomic structure of β-tantalum nanocrystallites. Microscopy and Microanalysis, 11(6), pp. 534-544. (doi: 10.1017/S1431927605050543) (PMID:17481332)
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Abstract
The structural properties of β-phase tantalum nanocrystallites prepared by room temperature magnetron sputter deposition on amorphous carbon substrates are investigated at atomic resolution. For these purposes spherical aberration-corrected high-resolution transmission electron microscopy is applied in tandem with the numerical retrieval of the exit-plane wavefunction as obtained from a through-focus series of experimental micrographs. We demonstrate that recent improvements in the resolving power of electron microscopes enable the imaging of the atomic structure of β-tantalum with column spacings of solely 0.127 nm with directly interpretable contrast features. For the first time ever, we substantiate the existence of grain boundaries of 30° tilt type in β-Ta whose formation may be well explained by atomic agglomeration processes taking place during sputter deposition.
Item Type: | Articles |
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Status: | Published |
Refereed: | Yes |
Glasgow Author(s) Enlighten ID: | Weides, Professor Martin |
Authors: | Tillmann, K., Thust, A., Gerber, A., Weides, M. P., and Urban, K. |
College/School: | College of Science and Engineering > School of Engineering > Electronics and Nanoscale Engineering |
Journal Name: | Microscopy and Microanalysis |
Publisher: | Cambridge University Press |
ISSN: | 1431-9276 |
ISSN (Online): | 1435-8115 |
Published Online: | 15 November 2005 |
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