Efficient and robust analysis of complex scattering data under noise in microwave resonators

Probst, S., Song, F.B., Bushev, P.A., Ustinov, A.V. and Weides, M. (2015) Efficient and robust analysis of complex scattering data under noise in microwave resonators. Review of Scientific Instruments, 86(2), 024706. (doi: 10.1063/1.4907935) (PMID:25725869)

Abstract

Superconducting microwave resonators are reliable circuits widely used for detection and as test devices for material research. A reliable determination of their external and internal quality factors is crucial for many modern applications, which either require fast measurements or operate in the single photon regime with small signal to noise ratios. Here, we use the circle fit technique with diameter correction and provide a step by step guide for implementing an algorithm for robust fitting and calibration of complex resonator scattering data in the presence of noise. The speedup and robustness of the analysis are achieved by employing an algebraic rather than an iterative fit technique for the resonance circle.

• Item Type: Articles
• Status: Published
• Refereed: Yes
• Glasgow Author(s) Enlighten ID: Weides, Professor Martin
• Authors: Probst, S., Song, F.B., Bushev, P.A., Ustinov, A.V., and Weides, M.
• College/School: College of Science and Engineering > School of Engineering > Electronics and Nanoscale Engineering
• Journal Name: Review of Scientific Instruments
• Publisher: AIP Publishing
• ISSN: 0034-6748
• ISSN (Online): 1089-7623
• Published Online: 07 February 2015
• Copyright Holders: Copyright © 2015 AIP Publishing LLC
• First Published: First published in Review of Scientific Instruments 86(2): 024706
• Publisher Policy: Reproduced in accordance with the publisher copyright policy