Vespucci, S., Naresh-Kumar, G., Trager-Cowan, C., Mingard, K.P., Maneuski, D., O'Shea, V. and Winkelmann, A. (2017) Diffractive triangulation of radiative point sources. Applied Physics Letters, 110(12), 124103. (doi: 10.1063/1.4978858)
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Abstract
We describe a general method to determine the location of a point source of waves relative to a twodimensional single-crystalline active pixel detector. Based on the inherent structural sensitivity of crystalline sensor materials, characteristic detector diffraction patterns can be used to triangulate the location of a wave emitter. The principle described here can be applied to various types of waves, provided that the detector elements are suitably structured. As a prototypical practical application of the general detection principle, a digital hybrid pixel detector is used to localize a source of electrons for Kikuchi diffraction pattern measurements in the scanning electron microscope. This approach provides a promising alternative method to calibrate Kikuchi patterns for accurate measurements of microstructural crystal orientations, strains, and phase distributions.
Item Type: | Articles |
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Additional Information: | . This work was carried out with the support from EPSRC Grant No. EP/ J015792/1 and through support from a Carnegie Trust Research Incentive Grant No. 70483. |
Status: | Published |
Refereed: | Yes |
Glasgow Author(s) Enlighten ID: | Maneuski, Dr Dima and O'Shea, Professor Val |
Authors: | Vespucci, S., Naresh-Kumar, G., Trager-Cowan, C., Mingard, K.P., Maneuski, D., O'Shea, V., and Winkelmann, A. |
College/School: | College of Science and Engineering > School of Physics and Astronomy |
Journal Name: | Applied Physics Letters |
Publisher: | AIP Publishing |
ISSN: | 0003-6951 |
ISSN (Online): | 1077-3118 |
Published Online: | 24 March 2017 |
Copyright Holders: | Copyright © 2017 The Authors |
First Published: | First published in Applied Physics Letters 110(12):124103 |
Publisher Policy: | Reproduced under a Creative Commons License |
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