Diffractive triangulation of radiative point sources

Vespucci, S., Naresh-Kumar, G., Trager-Cowan, C., Mingard, K.P., Maneuski, D., O'Shea, V. and Winkelmann, A. (2017) Diffractive triangulation of radiative point sources. Applied Physics Letters, 110(12), 124103. (doi: 10.1063/1.4978858)

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We describe a general method to determine the location of a point source of waves relative to a twodimensional single-crystalline active pixel detector. Based on the inherent structural sensitivity of crystalline sensor materials, characteristic detector diffraction patterns can be used to triangulate the location of a wave emitter. The principle described here can be applied to various types of waves, provided that the detector elements are suitably structured. As a prototypical practical application of the general detection principle, a digital hybrid pixel detector is used to localize a source of electrons for Kikuchi diffraction pattern measurements in the scanning electron microscope. This approach provides a promising alternative method to calibrate Kikuchi patterns for accurate measurements of microstructural crystal orientations, strains, and phase distributions.

Item Type:Articles
Additional Information:. This work was carried out with the support from EPSRC Grant No. EP/ J015792/1 and through support from a Carnegie Trust Research Incentive Grant No. 70483.
Glasgow Author(s) Enlighten ID:Maneuski, Dr Dima and O'Shea, Professor Val
Authors: Vespucci, S., Naresh-Kumar, G., Trager-Cowan, C., Mingard, K.P., Maneuski, D., O'Shea, V., and Winkelmann, A.
College/School:College of Science and Engineering > School of Physics and Astronomy
Journal Name:Applied Physics Letters
Publisher:AIP Publishing
ISSN (Online):1077-3118
Published Online:24 March 2017
Copyright Holders:Copyright © 2017 The Authors
First Published:First published in Applied Physics Letters 110(12):124103
Publisher Policy:Reproduced under a Creative Commons License

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